Electronic Materials Research Institute at Northeastern University

Nanomaterials Instrument Facility

Electronic Materials Research Institute (eMRI) at Northeastern University has access to an extensive set of facilities for materials research in the areas of nanotechnology and biotechnology. Laboratory space includes a variety of special instrumentation and unique laboratory set-ups. Below are the principal facilities available on a fee-for-service or collaborative basis. For more information please use the contact information for the relevant instrument below, or contact Don Heiman.

Microscopy - SEM, TEM
AFM, STM, MFM, NSOM
Chemical Analysis - EDX, ICPMS
Optical spectroscopy capabilities including ultra-fast lasers
Thin film deposition (such as PLD and MBE)
Microwave measurement capabilities, from dc to mm-wave
Cryogenic measurement capabilities, from mK upwards
High-field superconducting magnets (14T)
Powder x-ray

High-Resolution Field-Emission SEM	Hitachi S4800 - The Institute has recently acquired a state-of-the-art field-emission SEM, Hitachi S4800, having a resolution of 1 nm. It is equipped with accessories, including, energy dispersive x-ray analysis (EDAX) for determining chemical composition, as well as a Nabity nanolithography e-beam pattern generation system. This instrument is an eMRI user facility.
Electron Microscopy	Electron Microscopy Center - Provides instruction and supports research activities involving imaging technologies, such as light microscopes, scanning and transmission electron microscopes, and computer image analysis equipment. http://www.dac.neu.edu/biology/em/index.html TEM - JEOL JEM-1000 general purpose transmission electron microscope. SEM - AMRAY AMR-1000 scanning electron microscope is also used in a biology course on microscopy (BIO 3601, Biological Electron Microscopy).
Scanning Nanoprobes	Atomic force, magnetic force, scanning-tunneling, and near-field optical microscopes (AFM, NFM, STM, NSOM) are available either as user facilities or collaborative operation. AFM/MSM/STM - Agilent PicoPlus with liquid cell and electrochemical options. STM/AFM - RHK Model UHV 350, operating from 100-500 K in ultra-high vacuum.
Scanning Optical Nanoprobe	NSOM - Nanonics NSOM/SPM-100 near-field, scanning optical microscope with liquid helium temperature stage. CCD detectors for photoluminescence, fluorescence, reflectance, absorbance and Raman spectroscopies on the nanometer scale.
X-Ray Diffraction	Rigaku D/Max 2200, diffractometer, Cu k-α radiation.
SQUID Magnetometer	Quantum Design MPMS XL-5 SQUID magnetometer, with 5T maximum field, 10^-8 emu relative sensitivity, AC susceptibility, vertical rotator, EverCool Dewar, and optical access. http://www.squid.neu.edu
Analytical tools	Auger, RHEED, particle sizer, electrochemical workstation, Zeta potentiometer, magneto conductivity (T > 20mK, 9T), magneto-optics (9T, 14 T), MOKE, FTIR, Raman scattering, microwave apparatus, dielectometer. KLA-Tencor Laser surface scanner (200 nm resolution), two TSI CNC particle counters (10 nm resolution), goniometer, Nikon optical microscope system with auto-focus and an automated stage (1500x), four Megasonic and two ultrasonic cleaning stations, Headway Research Spinner, TSI particle classifier, bond tester, electrochemical work stations, particle size analyzer.
Chemical Analysis	Energy dispersive x-ray analysis (EDX), is available in the Hitachi S4800 SEM. Am inductively-coupled plasma mass spectrometer (IC PMS), VG Plasma Quad, measures chemical composition with part per billion sensitivity.